M4 Optical Emission Spectrometer is most suitable instrument for the determination of
various elements in different matrices (Fe, Cu, Al, Ni, Co, Mg, Ti, Zn, Pb, Sn, Ag, etc). It is an economical
and easy solution to quick analysis near the furnace, metal material quality analysis, research laboratories
and metal grade identification This also gives the user a truly economical spectrometer that’s both easy to
use and easy to space saved. The optical system uses a CMOS detector with a spectral range covering all
typical materials. It can accurately and reliably analyze from low-level elements to high-content elements.
Technical Data of M 4
Item |
Index |
Optical System |
Focal Length |
300mm |
Wavelength range |
165nm-589nm |
Detector |
6 High resolution CMOS detectors |
Light chamber |
vacuum type optics system |
Pixel resolution |
30pm |
Grating line |
3600m1/mm |
First order spectral line dispersion rare |
1.2nm/mm |
Average resolution ratio |
10pm/pixel |
Full spectrum |
Light chamber temperature is controlled automatically |
Spark Source |
Type |
Digital arc and spark source |
Spark frequency |
100-1000HZ |
Discharge current |
1-400A |
Ignition voltage |
>15000V |
Excitation light |
Optimization of discharge parameters design |
High energy precombustion technology HEPS |
|
Processor |
High-speed data synchronization acquisition and processing |
Spark Stand |
Electrode |
Tungsten electrode technology |
Make up |
Thermal deformation self-compensation design |
Argon flushed with minimal consumption of Argon |
Spray discharge electrode technology |
Spray discharge electrode technology |
Dimension |
714mm(L)*558mm*270mm(H) |
Weight |
About 40kg |
Storage temperature |
0℃-45℃ |
Operating temperature |
10℃-35℃, 23±2℃ is recommended |
Power |
AC220V/50Hz(Customized) |
Power consumption |
Excitation:400W/Stand by:50W |
Argon quality |
99.999%, Argon pressure>4Mpa |
Argon consumption |
5L/min during spark mode |
Interface |
Ethernet data transmission based on DM9000A |
Main Features
The M4 optical emission spectrometer has a number of patented technologies that enable
rapid determination of elements in metallic materials. The optical system uses a CMOS detector with a
spectral range covering all typical materials. It is accurate and reliable for analysis from low-level
elements to high-level elements. For different materials and different requirements, the cost-effective
full-spectrum direct reading spectrometer can meet the requirements of metal manufacturing, processing
industry and metal smelting for quality monitoring, material identification, material research and
development.
-
Optical system with superior performance
- The Paschen-Longge structure concave grating, full spectrum coverage, meets the
customer's need for full element detection.
- Direct optical technology and use optics made with MgF2 materials ensure optimum
performance in the UV region.
- High resolution multi-CMOS readout system, lower dark current, better detection
limit, higher stability, stronger sensitivity, meet N analysis requirements.
- The Paschen-Longge structure concave grating, full spectrum coverage, meets
the customer's need for full element detection.
- Direct optical technology and use optics made with MgF materials ensure optimum
performance in the UV region.
- High resolution multi-CMOS readout system, lower dark current, better detection
limit, higher stability, stronger sensitivity, meet N analysis requirements.
-
Humanized sample spark stand design
- The spark stand directly introduces the spark light into the optical system
Open sample stage for large sample testing requirements.
- Change electrodes provide better performance for small sample and complex
geometry samples.
-
Simple argon flow design
- Intelligent argon flow design and dust collection and cleaning device The
unique argon jet technology effectively eliminates the drift of the plasma during the spark process,
ensuring that the CCD detector can observe the high-temperature regional light signal, improving
accuracy and stability.
- After sparking, pulsed argon purge improves dust removal and improves
instrument short-term and long-term stability.
-
Fully intelligent vacuum measurement and control
- The vacuum system is fully programmed to reduce the running time of vacuum
pump while ensuring the vacuum.
- The two-stage setting turns on the standby vacuum operation state when the
instrument is not running.
- Multi-stage vacuum isolation measures and the addition of oil filter devices
ensure that optical components work in a reliable environment.
-
Convenient and quick lens cleaning device
- The integrated vacuum ball valve has good isolation when cleaning the lens.
Single-plate lens design, easy to assemble and disassemble.
- Cross-mechanical devices, the optical system is effectively protected without
isolation.
-
Cloud computing and reading system
- The computer and mobile phone (or PAD) can be displayed simultaneously for easy
panel operation.
- High resolution multi-CMOS readout system and FPGA, DSP and ARM technology for
data acquisition.
- Ethernet and TCP/IP protocols, data transmission is fast and reliable. Data can
be transmitted remotely and fully networked. Real-time monitoring and control of the operating state
of the instrument.
- Data can be cloud printed.
-
Dedicated spectral analysis software
- The international spectrometer produces a standard dedicated spectrometer
software with user-friendly interface and standardized functions.
- The instrument is equipped with multiple factory calibration curves and more
material analysis methods and advanced solutions in the software.
- The upper and lower limits of the standard curve can be extended on site
according to the material requirements of the user.
-
The instrument and software computing power is powerful
- Automatic optical path calibration
- Low argon consumption
- Universal adjustable sample adapter
- Base extension
- Standardized parameter modification
- Type standardization function
- Safer, more open and convenient design
- The result is displayed in real time, and the print report function can be
customized for the user.
- Software rapid diagnosis
- Simple interface operation
- Reliable factory calibration